DEVICE FOR TESTING SEMICONDUCTOR DEVICES AT CRYOGENIC TEMPERATURES,申请号SU19853861895-传众专利搜索

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发明名称	DEVICE FOR TESTING SEMICONDUCTOR DEVICES AT CRYOGENIC TEMPERATURES
摘要
申请公布号	SU1292457(A1)	申请公布日期	1988.05.07
申请号	SU19853861895	申请日期	1985.02.27
申请人	KABANOV V.I.,SU;VASILEVA E.S.,SU	发明人	KABANOV V.I.,SU;VASILEVA E.S.,SU
分类号	G01R31/26	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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