发明名称 INSPECTION APPARATUS OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To enable an ink to be splashed on the surface of a chip without scratching the chip by a method wherein, within an inker applicable to the inspection process of a semiconductor integrated circuit, an electrode is provided on a position between a semiconductor substrate and a dripping end of an ink well to impress the electrode and said dripping end of the ink well with voltage. CONSTITUTION:A cylindrical electrode 7 is provided to be connected to a plus power supply through an electric switch 8 in the end direction of an ink well 3 made of conductive material previously grounded. Probes 2 are brought into contact with an integrated circuit chip surface of a semiconductor substrate 1 and after finishing the inspection process, the switch 8 is closed to impress the electrode 7 with high voltage so that ink may be splashed on the chip surface by an electric field generated between the end of ink well 3 and the electrode 7. Through these procedures, the gap between the end of ink well 3 and the integrated circuit chip on the semiconductor substrate can be adjusted easily so that the ink may be splashed on the chip surface without scratching the chip.
申请公布号 JPS63102330(A) 申请公布日期 1988.05.07
申请号 JP19860248740 申请日期 1986.10.20
申请人 MATSUSHITA ELECTRONICS CORP 发明人 TSUURA KATSUHIKO
分类号 H01L21/66;B41J2/01 主分类号 H01L21/66
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