发明名称 HEMT with etch-stop
摘要 A compound semiconductor device comprises an enhancement-mode transistor and a depletion-mode transistor, each of which has a heterojunction and utilizes a two-dimensional electron gas. The method of producing the device comprises the steps of: forming an undoped GaAs channel layer on a semi-insulating GaAs substrate; forming an N-type AlGaAs electron-supply layer so as to form the heterojunction; forming an N-type GaAs layer; forming an AlGaAs layer; selectively etching the AlGaAs layer to form a recess; performing an etching treatment using an etchant which can etch rapidly GaAs and etch slowly AlGaAs to form simultaneously grooves for gate electrodes of the enhancement-mode transistor and the depletion-mode transistor, the bottoms of the grooves being in the N-type AlGaAs layer and the distance between the bottoms being equal to the thickness of the AlGaAs layer; and forming simultaneously the gate electrodes in the grooves.
申请公布号 US4742379(A) 申请公布日期 1988.05.03
申请号 US19840676359 申请日期 1984.11.29
申请人 FUJITSU LIMITED 发明人 YAMASHITA, YOSHIMI;KOSEMURA, KINJIRO;ISHIWARI, HIDETOSHI;YAMAMOTO, SUMIO;KURODA, SHIGERU
分类号 H01L21/306;H01L21/8236;H01L21/8252;H01L27/06;H01L29/778;(IPC1-7):H01L29/80 主分类号 H01L21/306
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