发明名称 X-RAY SPECTRUM MEASURING INSTRUMENT
摘要 PURPOSE:To reduce the size of an X-ray spectrum measuring instrument and obtain an X-ray spectrum with a high accuracy by dividing the front surface of a scintillator provided with a fluorescence detector on its rear into plurality of section and arranging X-ray filters with different thicknesses in the sections. CONSTITUTION:Scintillators 8s, 8a-8d that emit fluorescence when X-rays are incident are arranged and light detectors 10s, 10a-10d are brought into close contact with the rear of the scintillators 8s, 8a-8d, respectively. Further, X-ray filter 9a-9d with increasing thickness in the mentioned order are arranged in close contact with the front surface of the scintillators 8a-8d, respectively. An envelope 7 surrounds X-ray detectors 1s, 1a-1d individually prevent mutual interference. Signal data outputted from the detectors 1s, 1a-1d of an X-ray detecting unit 1 constructed as above are amplified 3, A/D-converted 4, calculated and stored in an arithmetic storage unit 5 and displayed 6. Thus, the size of an X-ray spectrum measuring instrument can be reduced and a spectrum can be obtained in a short time with a high accuracy.
申请公布号 JPS6398583(A) 申请公布日期 1988.04.30
申请号 JP19860243091 申请日期 1986.10.15
申请人 KASEI OPTONIX CO LTD 发明人 MIYAKE SHUSAKU
分类号 G01N23/00;G01T1/20;G01T1/36 主分类号 G01N23/00
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