发明名称 ETCHING TECHNIQUES
摘要 <p>A highly selective --greater than 100 to 1-- etch for silicon, tantalum, molybdenum and tungsten and non-oxidic tantalum, molybdenum and tungsten compositions such as tantalum silicide and tantalum nitride, molybdenum silicide and tungsten silicide,relative to their oxidic counterparts and silicon nitride is achieved by using polyatomic halogen fluorides. The selectivity (3) which is greater than 100 to 1 for silicon, tantalum and non-oxidic tantalum, is achievable without employing plasmas or wet etching.</p>
申请公布号 CA1235630(A) 申请公布日期 1988.04.26
申请号 CA19840457419 申请日期 1984.06.26
申请人 AMERICAN TELEPHONE AND TELEGRAPH COMPANY 发明人 COOK, JOEL M.;DONNELLY, VINCENT M.;FLAMM, DANIEL L.;IBBOTSON, DALE E.;MUCHA, JOHN A.
分类号 H01L21/302;C04B41/53;C09K13/08;C23C16/44;C23F1/12;H01L21/3065;H01L21/311;H01L21/3213;(IPC1-7):H01L21/306 主分类号 H01L21/302
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