| 摘要 |
The object of the invention is a method for the automatic sequential checking of a card carrying electronic components. The method comprises a learning phase which involves moving at least two mobile keys 3 and 7 with respect to a card assessed as being satisfactory, bringing these two keys successively into contact with two points of the card between which a measurement is to be made, and at each measurement storing in memory the coordinates of the keys 3 and 7, the value to be measured and the acceptable limits of this value. In a checking phase, the displacement of the mobile keys with respect to the card under test is controlled so as to bring these keys successively opposite each pair of points, the desired measurement is carried out between these two points, and the result of this measurement is compared with the value stored in memory; if the measured value lies within the tolerance limits, the next measurement is then carried out; if it does not lie within these limits, the defect is indicated. <IMAGE>
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