| 摘要 |
<p>An apparatus for spectral analysis of chemical fractions in which separate samples (80) are frozen on a substrate (28), and infrared radiation (62) passes through the sample either before or after it is reflected from a surface (44) on the other side of the substrate from the sample. This permits radiation to move toward and away from the sample at the same side of the sample, thus simplifying the sample-cooling and sample-deposition techniques. The optical system is designed to defocus (and thus avoid detection of) unwanted radiation reflected by the sample.</p> |
