发明名称 Telescoping pin probe
摘要 A probe for use in electrical circuit test equipment, in which a contact element is longitudinally slidable in an insulator sleeve which also contains an R-C attenuator circuit connected electrically to the contact element by an electrically conductive elastomeric material. A high impedance cable is connected electrically to the other end of the RC attenuator circuit by another piece of conductive elastomeric material. The cable connects the attenuator to another R-C circuit which, together with the attenuator, forms a voltage divider, and the attenuated signal controls an amplifier which provides a signal through a low impedance cable to a test equipment.
申请公布号 US4739259(A) 申请公布日期 1988.04.19
申请号 US19860891834 申请日期 1986.08.01
申请人 TEKTRONIX, INC. 发明人 HADWIN, MATTHEW J.;GARCIA, JOHN D.;HARRY, EMORY J.
分类号 G01R1/067;G01R1/073;G01R31/28;H01R11/18;(IPC1-7):G01R1/073 主分类号 G01R1/067
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