X-RAY STRESS MEASURING INSTRUMENT,申请号JP19860233767-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	X-RAY STRESS MEASURING INSTRUMENT
摘要
申请公布号	JPS6385435(A)	申请公布日期	1988.04.15
申请号	JP19860233767	申请日期	1986.09.30
申请人	SHIMADZU CORP	发明人	SEKIGUCHI HARUO
分类号	G01L1/25;G01N23/207	主分类号	G01L1/25
代理机构		代理人
主权项
地址

您可能感兴趣的专利

Methods and systems for an interactive theorem-proving tool with reflective capabilities

Light emitting device and method of manufacturing thereof

Double-decker MRAM cell with rotated reference layer magnetizations

Video summary description scheme and method and system of video summary description data generation for efficient overview and browsing

Method and apparatus for ECP element inflation utilizing solid laden fluid mixture

Capacitor with single sided partial etch and stake

High performance sense amplifier and method thereof for memory system

Quadrifilar helical antenna

Television/internet terminal user interface

System and method for remote programming of an implantable medical device

Method and system for network-based, distributed, real-time command and control of an enterprise

Flip chip heat sink package and method

Field emission display device and method of manufacturing same

Ordering rule controlled command storage

Optical component and manufacturing method thereof, microlens substrate and manufacturing method thereof, display device, and imaging device

Gas injection moulding method and apparatus

Semiconductor device having a gate insulating layer being mainly made of silicon oxynitride (SiON) having a compression strain state as its strain state

Method for controlling spacer oxide loss

Method for desulfurizing thiophene derivatives contained in fuels

Imaging element having improved crack propagation during conversion