发明名称 INSPECTION INSTRUMENT FOR FOREIGN MATTER
摘要 PURPOSE:To shorten an exhaust time, by providing a discharging and a cleaning electrode consisting of a cathode and an anode covering the cathode in a vacuum vessel, making plus ions discharge to collide them on the surface plane of the vessel, and separating a foreign matte from adsorbing gas. CONSTITUTION:A wafer is placed on a mobile stage 2 of the vacuum vessel 1, a laser beam is emitted from a laser device 5 to make it scan. Reflected light is received at a foreign matter detector 7, then the foreign matter is detected, and it is analyzed by an ion microanalyzer 8, and a mass spectrograph 9. Also, a discharging cathode 15, and the anode 16 being set so as to cover the cathode, are provided. Then, discharging gas 11 is introduced, and the inside of the vessel 1 is exhausted by a vacuum pump 10, and an electron is emitted by heating the cathode 15 by a power source 17, and a glow discharge is generated between the anode 16, and he vessel 1 and the stage 2. The foreign matter is separated from the adsorbing gas by making the plus ion generated by the above discharge collide on the surface of the vessel 1 and the stage 2. Therefore, since discharging and cleaning function is added on an analyzer, it is possible to shorten the exhaust time, and to reduce attainable pressure.
申请公布号 JPS6383640(A) 申请公布日期 1988.04.14
申请号 JP19860228173 申请日期 1986.09.29
申请人 HITACHI LTD 发明人 OTAKA KENJI;ITO AKIKO
分类号 H01L21/66;G01N21/88;G01N21/94;G01N21/956 主分类号 H01L21/66
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