发明名称 FOREIGN MATTER INSPECTOR
摘要 PURPOSE:To achieve highly accurate detection, by jointly using two modes, one for detecting fine foreign matters and the other for relatively large foreign matters. CONSTITUTION:A P polarization component and an S polarization component are converted with respective detectors 8 and 9 into electrical signals corresponding to the quantity of light and the detector 8 is connected to a comparator circuit 10 while the detector 9 to a divider 12. The circuit 10 sends the signal by the P polarization component to a comparator circuit 11 and a divider 12 only when it exceeds a threshold P0. The circuit 11 sends a high-level detection signal to an OR gate G1 only when the signal from the circuit 10 exceeds a threshold P1 (when a foreign matter is detected) and a high-level foreign matter detection signal indicating the existence of a foreign matter is sent from an output terminal. The divider 12 sends a signal P/S based on the electrical signals P and S to a comparator circuit 13, which inputs a high-level signal into the gate G1 only when the signal exceeds a threshold M (when a foreign matter is detected) to output a foreign matter detection signal. This enables highly sensitive detection of fine and relatively large foreign matter simultaneously.
申请公布号 JPS6382348(A) 申请公布日期 1988.04.13
申请号 JP19860226041 申请日期 1986.09.26
申请人 HITACHI LTD 发明人 TANABE YOSHIKAZU
分类号 H01L21/66;G01N21/88;G01N21/94;G01N21/956 主分类号 H01L21/66
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