发明名称 TEST CIRCUIT
摘要 PURPOSE:To efficiently find out the physical location where an error occurred by providing a means for selecting the data of content of ROM compressed by a linear feedback shift register and the data of the content of ROM not compressed. CONSTITUTION:A signature output of a linear feedback shift register 5 being a data compressor and a data output of the ROM 3 are selected by using a selector 7. That is, in the test of contents of the ROM 3, the linear feedback shift register 5 is used to compress the data and it is judged as the occurrence of an error from the signature output, the select circuit 7 outputs a read data in the ROM 3. Thus, the test by the compressed data is made efficient and the physical location having an error is grasped easily.
申请公布号 JPS6381540(A) 申请公布日期 1988.04.12
申请号 JP19860226702 申请日期 1986.09.25
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 NISHIMICHI YOSHIHITO
分类号 G06F11/22 主分类号 G06F11/22
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