发明名称 Surface mensuration sensor
摘要 The invention is an apparatus having an improved arrangement of sensing and illumination elements for high speed, non-contact, three-dimensional mensuration of a surface. The surface is illuminated by a single plane of light producing a contour line. The line is viewed from two or more vantage points, alleviating shadowing from many types of large surface irregularities. The geometry of the apparatus is tolerant of moving surfaces, allows higher data rates and has great depth of field for the sensor.
申请公布号 US4737032(A) 申请公布日期 1988.04.12
申请号 US19850769442 申请日期 1985.08.26
申请人 CYBERWARE LABORATORY, INC. 发明人 ADDLEMAN, DAVID A.;ADDLEMAN, LLOYD A.
分类号 G01B11/25;G05B19/42;(IPC1-7):G01B11/24 主分类号 G01B11/25
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