| 摘要 |
<p>In an automatic testing intrument, to store responses educed from an equipment (4) under test in response to stimuli sent thereto, a response memory (16) is used. This response memory includes two serial/parallel shift registers (Z5, Z4), a buffer (Z2), a static RAM (Z3) and an input/output buffer (Z1). The response memory is capable of accepting the data bits being transmitted by the equipment under test at different data rates, corresponding to either serial or parallel inputted data bits.</p> |
