发明名称 TESTING SYSTEM FOR RAS CIRCUIT
摘要 PURPOSE:To reduce time and data volume required for test by inputting a test signal to RAS circuits of the same type to collectively test functions of the RAS circuits. CONSTITUTION:A same circuit deciding circuit 111 checks mounting states of RAS circuits of the same type based on the mounting data of a circuit board stored in a mounting data storage means 141. A test data converting means 113 converts data, which is stored in a test data storage means 131 and is required for the function test of RAS circuits, to signal to be inputted to RAS circuits to be tested. A data distributing means 115 inputs the test signal converted by the test data converting means 113 to a circuit testing means 117 in accordance with mounting states of RAS circuits obtained by the same circuit discriminating means 111. The circuit testing means 117 collectively tests RAS circuits and outputs results.
申请公布号 JPS6375845(A) 申请公布日期 1988.04.06
申请号 JP19860220782 申请日期 1986.09.18
申请人 FUJITSU LTD 发明人 SHIMADA HIROMI
分类号 G06F11/22;G06F11/16 主分类号 G06F11/22
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