首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
METHOD AND DEVICE FOR DETECTING SEMICONDUCTOR PARAMETER OF POLYCRYSTALLINE SEMICONDUCTOR ROD
摘要
申请公布号
JPS6375647(A)
申请公布日期
1988.04.06
申请号
JP19870228245
申请日期
1987.09.11
申请人
SIEMENS AG
发明人
UORUFUGANGU KERAA
分类号
G01N27/00;G01N1/04;G01N1/44
主分类号
G01N27/00
代理机构
代理人
主权项
地址
您可能感兴趣的专利
DATA STORAGE DEVICE
PARALLEL PROCESS PROGRAM TRANSLATION PROCESSOR
NUMERICAL CONTROL METHOD AND ITS CONTROLLER
ELECTROPHOTOGRAPHIC COPYING DEVICE
APPARATUS FOR DETERMINING AMINO ACID SEQUENCE
IMMUNOLOGICAL ANALYZING ELEMENT AND ANALYZING METHOD
AUDIO MAIL SWITCHING SYSTEM
LINE SWITCHING SYSTEM
CONSTRAINT DEVICE CONSTRAINING FREIGHT
TELEPHONE RACK FOR AUTOMOBILE
INSTALLATION STRUCTURE OF SEAT
CAR BODY POSTURE CONTROLLER
FITTING IN METHOD FOR RIM OF WHEEL WITH AUTOMOBILE TIRE AND BEAD AND ITS FITTING IN DEVICE
AGRICULTURAL WORK MACHINE TRAVEL DEVICE FOR WET RICE FIELD
FORMING METHOD OF BUMP ELECTRODE
MANUFACTURE OF SEMICONDUCTOR DEVICE
METHOD AND STRUCTURE FOR COIL WHOSE MAGNETOMOTIVE FORCE EFFECTIVELY INTERLINK WITH CORE SECTION
IMPACT DOT PRINTER
CHECK RING FOR RESIN MADE SCREW
TANK STRUCTURE FOR HOT WATER FEEDING SYSTEM