| 摘要 |
PURPOSE:To quickly and accurately confirm trouble recovery by automatically generating test data of trouble if device abnormality occurs in the system of an electronic computer or the like and running this test immediately when a maintenance operator recovers the trouble part. CONSTITUTION:A test data automatic generating mechanism 12 always takes in log data 14 related to a storage device 10 and cyclically stores this data in a memory. If trouble occurs in the storage device 10, the log data memory is read out to obtain the information of the error position, an event code, and log information. The maintenance operator watches this log data 14 to perform the recovery. The test data automatic generating mechanism 12 generates seek information, a data pattern, and initializing information from position information, the event code, and log information respectively. A test data generating part generates test data based on them. After recovering trouble, the maintenance operator performs the test with said generated test data. |
