Apparatus for fast generation of large quantities of test data words in a test facility

摘要

A test data generator and a test data converter are provided for generating test data words which are allocated to the terminal elements of a card module having electronic components. Dependent on a test program, the test data generator generates one or more test data vectors per test step to be executed. The test data converter generates the test data words from a test data vector or from further test information, and allocates individual bits of a test vector or of the test information to individual terminal elements of the unit under test. The allocation of the individual bits of the test vector or of the test information to the individual terminal elements of the unit under test can be freely set.