| 摘要 |
PURPOSE:To enable to test accurately without inconvenience such as the presence of a common electrode, by a method wherein a common electrode on a thermal head is formed at the last process, and a short-circuit test and an open- circuit test for lead wires is conducted before heating resistors are exposed. CONSTITUTION:A uniform resistor layer 6 is provided on a substrate 1, then a uniform conductor layer 7 is provided thereon, and a material comprising laminates of the resistor layer and lead wires 2 provided in a rectangular tape form is obtained by a photolithographic technique using a mask provided with a plurality of strip form windows 201 in parallel with each other. At this stage, an open-circuit test and a short-circuit test for the lead wires 2 are conducted by bringing probes 801-803 into contact with the lead wires 2. Thereafter, a part of the resistor layer 6 is exposed by a photolithographic technique using a mask provided with a transverse window 4, thereby providing a heating part. Subsequently, the common electrode 3 which functions in common for each of the rectangular tapes is provided on the remaining lead wires 2, thereby completing the thermal head. |
