发明名称 Verfahren zur Herstellung glaspassivierter Halbleiterbauelemente
摘要 The semiconductor element mfr. has crystal orientated highly doped semiconductor layers (3,4) formed in the opposing surfaces of a semiconductor disc (1), before application of a marking layer (5). The semiconductor layer (3) and the masking layer (5) on one side of the semiconductor disc (1) are structured by the formation of recesses at a given orientation to the crystal orientation, with subsequent etching to form channels of defined width and depth and angled sides, filled with a glass paste after removal of the masking layer (5). USE/ADVANTAGE - Esp. for power semiconductor element or diode mfr. Reduced mfg. complexity and cost.
申请公布号 DE4114660(C2) 申请公布日期 1997.09.18
申请号 DE19914114660 申请日期 1991.05.06
申请人 TEMIC TELEFUNKEN MICROELECTRONIC GMBH, 74072 HEILBRONN, DE 发明人 LUEFTINGER, ERNST, ALTMUENSTER, AT
分类号 H01L23/31;H01L29/06;(IPC1-7):H01L23/28;H01L21/78 主分类号 H01L23/31
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