发明名称 DEFLECTION SYSTEM FOR CHARGED-PARTICLE BEAM
摘要 A system for achromatically deflecting a beam of charged particles without producing net divergence of the beam comprises three successive magnetic deflection means (A,B,C) which deflect the beam alternately in opposite directions, the first (A) and second (B) by angles of less than 50 DEG and the third (C) by an angle of at least 90 DEG ; particles with different respective energies are transversely spaced as they enter the third deflection means (C), but emerge completely superimposed in both position and direction, and may be brought to a focus (F) in each of two mutually perpendicular planes a short distance thereafter. Such a system may be particularly compact, especially in the direction in which the beam leaves the system, and is suitable for deflecting a beam of electrons from a linear accelerator (5,6,7) so as to produce a vertical beam of electrons (or with an X-ray target, of X-rays) which can be rotated about a horizontal patient for radiation therapy.
申请公布号 DE3176656(D1) 申请公布日期 1988.03.24
申请号 DE19813176656 申请日期 1981.05.29
申请人 PHILIPS ELECTRONIC AND ASSOCIATED INDUSTRIES LIMITED;N.V. PHILIPS' GLOEILAMPENFABRIEKEN 发明人 BATES, TERENCE
分类号 G21K1/08;(IPC1-7):G21K1/08 主分类号 G21K1/08
代理机构 代理人
主权项
地址