发明名称 X-RAY FLUORESCENT EMISSION ANALYSIS TO DETERMINE MATERIAL CONCENTRATION
摘要 A method and apparatus is disclosed to determine a concentration of dopant i n soot that constitutes at least a portion of a soot preform (12) used to form an optical wave guide. The photon source (30) irradiates the soot preform on a mandrel (14). X-ray fluorescent emissions, from the irradiated soot are detected, and the concentration of dopant is determined based on the detecte d X-ray fluorescent emissions. Additionally, the concentration of dopant in layers of soot on the preform can be controlled by utilizing the detected X- ray fluorescent emissions to determine a deviation between a concentration o f dopant in the soot and a predetermined concentration, and adjusting depositi on conditions based on the deviation.
申请公布号 CA2355742(A1) 申请公布日期 2000.06.29
申请号 CA19992355742 申请日期 1999.12.06
申请人 CORNING INCORPORATED 发明人 QUINN, ALAN P.
分类号 C03B37/018;G01N23/223;(IPC1-7):G01N23/223;B29B11/00 主分类号 C03B37/018
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