VERFAHREN ZUR PRUEFUNG EINES TRAEGERS MIT MEHREREN INTEGRIERTEN DIGITALSCHALTUNGEN, GEEIGNETE INTEGRIERTE SCHALTUNG ZUM ANBRINGEN AUF EINEM AUF DIESE WEISE ZU PRUEFENDEN TRAEGER UND TRAEGER MIT MEHREREN DERARTIGEN INTEGRIERTEN SCHALTUNGEN

摘要

An arrangement for testing integrated circuits provided on a carrier comprises a series input (22) and a series output (24) for test and result patterns, and a mode control register (30) to receive a mode control signal train via the serial input. Under the control of said mode control signal train the serial input and output can be shortcircuited to each other, or further registers (32, 34, 36) can be selectively filled and emptied. In this manner, both the interior of the integrated circuit and respective interconnection functions can easily be tested by means of a universal protocol. Integrated circuits and the carrier only require minor extension/adaptations.