发明名称 A METHOD OF PRODUCING A SEMICONDUCTOR DEVICE.
摘要 <p>A semiconductor device (G) is manufactured in the following process: (A) two insulating films of different chemical properites, e.g., SiO2 (12) and Si-N (11), are formed on a GaAs substrate (1) with a conducting layer (5). (B) A photoresist pattern (21) is formed. (C) The top layer (11) is removed by reactive ion etching with CF4 gas plasma. (D) The bottom layer (12) is removed by wet etching. (E) Ohmic electrodes (3) are formed by lift-off method. (F) Another Si-N film is formed on top. (G) The above process is repeated and a gate electrode (2) and a lower wiring layer (4) are formed.</p>
申请公布号 EP0259490(A1) 申请公布日期 1988.03.16
申请号 EP19860902001 申请日期 1986.03.05
申请人 SUMITOMO ELECTRIC INDUSTRIES LIMITED 发明人 EBATA, TOSHIKI OSAKA WORKS OF SUM.
分类号 H01L21/28;H01L21/285;H01L21/60;H01L21/768;H01L23/485;H01L29/417;(IPC1-7):H01L21/88 主分类号 H01L21/28
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