发明名称 MEASURING INSTRUMENT
摘要 PROBLEM TO BE SOLVED: To shorten measuring times by eliminating surface treatment. SOLUTION: A measuring part 2 repeatedly acquires with every prescribed time interval, a series of characteristic data indicating characteristics of an analytical object signal of a measured object. A display control flag 3 sets whether characteristic data obtained by the measuring part 2 is to be displayed on a display 8. A measurement control part 4 is controlled to skip writing control for displaying a waveform of the characteristic data, obtained by the measuring part 2 on an image plane of the display 8, when the setting in the display control flag 3 is 'not displayed' in obtaining new characteristic data and to obtain the next characteristic data.
申请公布号 JP2002014118(A) 申请公布日期 2002.01.18
申请号 JP20000195711 申请日期 2000.06.29
申请人 ANRITSU CORP 发明人 USUI HIDEKI
分类号 G01D7/00;G01R13/20;G01R23/16;G01R23/173;H04Q1/20;(IPC1-7):G01R13/20 主分类号 G01D7/00
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