发明名称 |
X-ray examination apparatus |
摘要 |
The present invention concerns an X-ray examination apparatus allowing to produce images of an object through the scanning of the object by at least two fan-shaped beams having different energy spectra, and obtained from a single X-ray source, thereby allowing to obtain simultaneously images of the object adapted to contain different informations. |
申请公布号 |
US4731807(A) |
申请公布日期 |
1988.03.15 |
申请号 |
US19860913126 |
申请日期 |
1986.09.29 |
申请人 |
THOMSON-CGR |
发明人 |
PLESSIS, ANDRE;GABBAY, EMILE;TROTEL, JACQUES |
分类号 |
A61B6/03;(IPC1-7):G21K5/10;G21K3/00 |
主分类号 |
A61B6/03 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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