发明名称 Heterogeneous conformal CVD of arsenosilicate glass
摘要 The use of arsenosilicate glass (ASG) as a dielectric layer in semiconductors, and methods of producing arsenosilicate glasses as conformal coatings are described. The ASG coatings may be produced as the result of heterogeneous reactions involving silane, arsine and oxygen. In multilevel semiconductors ASG may be used over the polysilicon gates 3, over aluminum metallization 5 and second dielectric layer 6, and/or over second metallization 7.
申请公布号 US4731346(A) 申请公布日期 1988.03.15
申请号 US19850691819 申请日期 1985.01.16
申请人 BRITISH TELECOMMUNICATIONS PUBLIC LIMITED COMPANY 发明人 ASHWELL, GARETH W. B.
分类号 H01L21/768;H01L21/316;H01L21/3205;H01L21/56;H01L23/29;H01L23/31;H01L23/532;(IPC1-7):H01L29/167;H01L21/95;H01L29/78 主分类号 H01L21/768
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