发明名称 Automatic dimension analyzer
摘要 An automatic dimension analyzer is disclosed which comprises a power driven table on which an object being measured is placed, the table being movable in orthogonal directions, and an optical system for forming an optical image of the object in a sample point field. The sample point field is electronically scanned in a rectangular raster format to produce sample point data bits each representing a sample point having a predetermined optical level. A cursor generator is synchronized with the raster to generate a cursor in the sample point field. A coincidence detector is provided to detect a coincidence between a sample point data bit and the cursor. Measurement instructions are stored in sequentially addressible locations of a memory through a data entry means. A microprocessor addresses the memory locations to retrieve the instructions to cause one of the table and the cursor to move relative to the other so that sample points derived from the object move toward the cursor and detect the position of the table or cursor relative to a reference upon the detection of a coincidence by the coincidence detector.
申请公布号 US4731745(A) 申请公布日期 1988.03.15
申请号 US19840677599 申请日期 1984.12.03
申请人 SHIN-ETSU ENGINEERING CO., LTD. 发明人 KATAGIRI, KIYOO;KASUKAWA, KOZO;MANABE, SHIGENAGA
分类号 G01B11/00;G01B11/02;(IPC1-7):G01B11/14;G06K9/46;H04N7/18 主分类号 G01B11/00
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