发明名称 Defect type classifying method
摘要 The invention relates to a method for non-destructive testing of materials, in which at least two differently guided waves (modes) are produced in the solid body, each at at least one specified angle, the measured reflection values are placed in relation to a reference echo in order to obtain a relative reflection value, and the relative reflection values of the individual modes are again placed in relation to one another, thereby enabling the size and type of the defects to be determined.
申请公布号 US2002166384(A1) 申请公布日期 2002.11.14
申请号 US20020133244 申请日期 2002.04.26
申请人 BETRIEBSFORSCHUNGSINSTITUT VDEH INSTITUT FUR ANGEWANDTE 发明人 COEN GUNTHER;LUNH ERNST;OBERHOFF DIETMAR
分类号 G11C15/00;G11C15/04;(IPC1-7):G01N29/00 主分类号 G11C15/00
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