发明名称 SMALL LEADING CURRENT CUTOFF TEST CIRCUIT FOR CIRCUIT BREAKER
摘要 <p>PURPOSE:To enable a circuit breaker to be tested at a voltage higher than the rated voltage of a booster by applying the voltage of first and second voltage source circuits to one and the other terminals of the circuit breaker to be tested, respectively. CONSTITUTION:First and second voltage source circuits 8 and 1 are composed of boosters 6 and 11 and capacitors 5 and 10 driven by a generator 1, respectively. When the generator 1 is operated, the first and second boosters 6 and 11, respectively, are operated and the sum of current flowing in the voltage source circuits 8 and 12 flows in an auxiliary circuit breaker 9. The current of the first voltage source circuit 8 flows in a circuit breaker 4 to be tested. When last-said current is cut off by the circuit breaker 4 to be tested, the recovery voltage of the first voltage source circuit 8 is applied to the one terminal of the circuit breaker 4. Further, by cutting off the current of the second voltage source circuit 12 by the auxiliary circuit breaker 9, the recovery voltage of the second voltage source circuit 12 is applied to the other terminal of the circuit breaker 4 to be tested.</p>
申请公布号 JPS6358181(A) 申请公布日期 1988.03.12
申请号 JP19860202049 申请日期 1986.08.27
申请人 MITSUBISHI ELECTRIC CORP 发明人 NAKAMURA HITOSHI
分类号 G01R31/327;G01R31/333 主分类号 G01R31/327
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