发明名称 Polishing apparatus
摘要 A polishing apparatus can detect completion of initialization of a polishing pad quantitatively. The polishing apparatus has a polishing table having a polishing pad attached thereto and a substrate holder configured to bring a surface of a substrate into contact with the polishing pad and press the substrate against the polishing pad. The polishing apparatus also has a drive mechanism operable to drive at least one of the polishing table and the substrate holder so as to provide a relative movement between the polishing pad and the substrate. The polishing apparatus includes a current sensor operable to detect a drive current supplied to the driving mechanism. The polishing apparatus also includes a polishing pad condition detector operable to detect a condition of the polishing pad based on the drive current detected by the current sensor when the dummy substrate is polished by a relative movement between the polishing pad and a dummy substrate held by the substrate holder.
申请公布号 US7189139(B2) 申请公布日期 2007.03.13
申请号 US20050098430 申请日期 2005.04.05
申请人 EBARA CORPORATION 发明人 ONO KATSUTOSHI
分类号 B24B49/00;B24B1/00;B24B37/00;B24B37/04;B24B49/10;B24B51/00;B24B53/007;B24B53/017;B24B53/02;H01L21/304 主分类号 B24B49/00
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