发明名称 |
JIG FOR CHECKING LEAK OF BELLOWS FOR SEMICONDUCTOR EQUIPMENT AND APPARATUS FOR CHECKING LEAK THEREOF |
摘要 |
A jig for checking leak of a bellows for semiconductor equipment and an apparatus for checking leak are provided to enhance a yield by shortening an exchanging time of the bellows. A first cap(20) is used for covering one end of a bellows in order to seal up the bellows. A second cap(30) is used for covering the other end of the bellows. The second cap includes an outlet. A plurality of shafts(40) are coupled with combination holes formed at both ends of the bellows between the first cap and the second cap by using a bolt. The shafts are used for maintaining a constant distance between the combination holes in order to prevent the contraction of the bellows.
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申请公布号 |
KR100689865(B1) |
申请公布日期 |
2007.02.26 |
申请号 |
KR20060008621 |
申请日期 |
2006.01.27 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KANG, SHIN HEE |
分类号 |
H01L21/02 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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