发明名称 JIG FOR CHECKING LEAK OF BELLOWS FOR SEMICONDUCTOR EQUIPMENT AND APPARATUS FOR CHECKING LEAK THEREOF
摘要 A jig for checking leak of a bellows for semiconductor equipment and an apparatus for checking leak are provided to enhance a yield by shortening an exchanging time of the bellows. A first cap(20) is used for covering one end of a bellows in order to seal up the bellows. A second cap(30) is used for covering the other end of the bellows. The second cap includes an outlet. A plurality of shafts(40) are coupled with combination holes formed at both ends of the bellows between the first cap and the second cap by using a bolt. The shafts are used for maintaining a constant distance between the combination holes in order to prevent the contraction of the bellows.
申请公布号 KR100689865(B1) 申请公布日期 2007.02.26
申请号 KR20060008621 申请日期 2006.01.27
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KANG, SHIN HEE
分类号 H01L21/02 主分类号 H01L21/02
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