| 摘要 |
An adaptor for electrically connecting an irregular array of terminals of a circuit device to be tested to a regular array of terminals of a universal test fixture for automatic testing equipment. The adaptor includes a top plate having an aperture pattern that corresponds to the terminal pattern of the circuit device, a bottom plate having an aperture pattern that corresponds to the universal test fixture, and an alignment plate intermediate the top and bottom plates having apertures so disposed as to guide rigid probes extending from individual ones of the apertures in the top plate into preselected ones of the apertures in the bottom plate. A method for fabricating the adaptor is also disclosed. |
