发明名称 Telescoping pin probe.
摘要 <p>A probe for use in electrical circuit test equipment, in which a contact element (30) is longitudinally slidable in an insulator sleeve (32) which also contains an R-C attenuator circuit (34) connected electrically to the contact element (30) by an electrically conductive elastomeric material (36). A high impedance cable is connected electrically to the other end of the RC attenuator circuit (34) by another piece of conductive elastomeric material (38). The cable connects the attenuator to another R-C circuit which, together with the attenuator, forms a voltage divider, and the attenuated signal controls an amplifier which provides a signal through a low impedance cable to a test equipment.</p>
申请公布号 EP0257832(A2) 申请公布日期 1988.03.02
申请号 EP19870306811 申请日期 1987.07.31
申请人 TEKTRONIX, INC. 发明人 HADWIN, MATTHEW J.;GARCIA, JOHN D.;HARRY, EMORY J.
分类号 G01R1/067;G01R1/073;G01R31/28;H01R11/18 主分类号 G01R1/067
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