Chip-placement machine with test function.

摘要

In an electronic chip placement machine (60) with test function, there is provided a suction nozzle (4) for holding a chip (5), a chip-regulation device (7) for regulating the attitude of the chip by clamping the chip at portions having no electrodes (5a, 5b), probes (l4a, l4b, l5a, l5b) for testing electrical characteristics of the chip. The tip portion (4a) of the suction nozzle is made of an insulating material such as a ceramic or a synthetic resin in order to avoid a short-circuit between electrodes of the chip through the nozzle. Therefore, the electrical characteristics of the chip can be tested without the separation between the nozzle and the chip. Furthermore, since one cycle of the operational process come to short, it is possible to provide chip-test and placement machines whose structure is simple. As a result, productivity and durability can also be increased.