| 摘要 |
A method of testing an electronic circuit of the kind having an input port for receiving input vectors, an output port for providing output vectors, and a serial scan port for providing at least one serial scan vector reflecting the status of predetermined elements within the circuit, is performed by applying a sequence of test vectors to the input port as a plurality of sub-sequences each including at least one test vector. The serial scan vector is examined after each sub-sequence, and a determination is made as to whether a part of the serial scan vector indicates the presence of a defect in the circuit. In the event that part of the serial scan vector indicates the presence of a defect in the circuit, the corresponding part of a succeeding serial scan vector is prevented from indicating the presence of a defect.
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