发明名称 ELECTRON BEAM SCAN-TYPE ANALYZER
摘要 PURPOSE:To deal with an occasion when data are difficult to observe by allowing the selective switching between whether to display data by overlapping an image or to display data by cutting part of the image by means of a data photographing switch switching whether to photograph data or not. CONSTITUTION:A control unit checks whether a scanning start switch is turned on or not; if the judgement is NO, whether a data photographing switch is ON or OFF is checked, in case of ON a CRT screen is set to a normal mode (full screen), and in case of OFF the CRT screen is set to a partially-cut mode; then the operation is returned to (x) and waits for the scan start switch to be turned on. If the judgement of step (a) becomes YES, the control unit starts the scanning to display the sample image on the CRT, and the photographing proceeds. When the sample image is photographed with data overlapped on it, this switch can be left ON at steps (a), (b). When data are photographed with part of the image cut off, this switch must be kept ON until step (f) is reached.
申请公布号 JPS59201353(A) 申请公布日期 1984.11.14
申请号 JP19830076674 申请日期 1983.04.30
申请人 SHIMAZU SEISAKUSHO KK 发明人 ZENITANI FUKUO;HIRAI TERUJI;KAWAI MASAO
分类号 H01J37/20;G03B15/00;G03B42/02;H01J37/22;H01J37/256 主分类号 H01J37/20
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