| 摘要 |
PURPOSE:To test an integrated circuit efficiently by a method wherein pads of the identical function on more than one chips to be probed are connected by a wire so that a probing operation can be made simultaneously. CONSTITUTION:Integrated circuit chips CIP of identical structure are installed in such a way that they are arranged side by side after they have been turned by 180 deg. in relation to each other. Each of wires (4), (8), (11) and (12) connects the corresponding pads of the identical function with each other: 4 is connected with 4; 8 is connected with 8; 11 is connected with 11; and 12 is connected with 12, respectively. Therefore, if a probing pin is assigned to each corresponding pad, it is possible to simultaneously probe two chips on which pads are arranged in a hook-shaped position. Through this constitution, the time required to test one chip can be shortened and it is possible to lower costs. |
