发明名称 Contact for semiconductor and display devices
摘要 A device and corresponding method of fabrication thereof are disclosed, where the device provides a contact for semiconductor and display devices, the device including a substrate, a first wiring line assembly formed on the substrate, an under-layer formed on the first wiring line assembly, an organic insulating layer formed on the under-layer such that the organic insulating layer covers the under-layer, a pattern on the organic insulating layer for contact holes to expose the under-layer, etched contact holes formed in the under-layer in correspondence with the pattern such that the underlying first wiring line assembly is exposed to the outside, a cured organic insulating layer formed on the under-layer, and a second wiring line assembly formed on the organic insulating layer such that the second wiring line assembly is connected to the first wiring line assembly through the etched contact holes, and the corresponding method of fabrication including forming a first wiring line assembly on a substrate, forming an under-layer on the first wiring line assembly, forming an organic insulating layer such that the organic insulating layer covers the under-layer patterning the organic insulating layer to thereby form contact holes exposing the under-layer, etching the under-layer exposed through the contact holes such that the underlying first wiring line assembly is exposed to the outside, curing the organic insulating layer, and forming a second wiring line assembly on the organic insulating layer such that the second wiring line assembly is connected to the first wiring line assembly through the contact holes.
申请公布号 US7580088(B2) 申请公布日期 2009.08.25
申请号 US20070854059 申请日期 2007.09.12
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM JANG-SOO;KONG HYANG-SHIK;PARK MIN-WOOK;JEON SANG-JIN
分类号 G02F1/136;G02F1/1368;G02F1/1362;G03F7/40;H01L21/027;H01L21/336;H01L21/4763;H01L21/768;H01L21/77;H01L21/84;H01L27/12;H01L29/786 主分类号 G02F1/136
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