发明名称 High sheet resistance polycrystalline silicone film for increasing diode breakdown voltage.
摘要 <p>A method for providing a diode comprises the step of forming a highly resistive polycrystalline silicon layer (36) over the depletion region between the anode (30) and the cathode (32). The polycrystalline silicon layer reduces the radius of curvature of the depletion region and increases the diode breakdown voltage. The highly resistive layer is formed by depositing a polycrystalline silicon layer on the diode, implanting the lab with both P and N type dopants, and heating the resulting structure. Of importance, the sheet resistivity of the polycrystalline silicon layer is dependent on the temperature at which the layer is heated. The resistivity of this layer can be controlled with great precision.</p>
申请公布号 EP0255968(A2) 申请公布日期 1988.02.17
申请号 EP19870201373 申请日期 1987.07.17
申请人 SILICONIX INCORPORATED 发明人 BLANCHARD, RICHARD A.
分类号 H01L21/02;H01L29/06;H01L29/40;H01L29/861;(IPC1-7):H01L29/06;H01L29/91 主分类号 H01L21/02
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