发明名称 VERY LOW TEMPERATURE EQUIPMENT
摘要 PURPOSE:To improve the detection accuracy of the leak test by reducing the adsorbing capability of the adsorbing agent by heating at the leak test of a liquid helium gas, thereby preventing the adsorbing agent from adsorbing the leakage gas. CONSTITUTION:In conducting a leak test at the initial cooling time, when a gas supply valve 10 is first closed, an evacuation valve 11 is opened, and thermal switch 6 is evacuated by a vacuum pump, then a bellows 25 contracts and plate bodies 23 and 26 depart, whereby the plate bodies 23, 26 have only very small heat transfer due to radiation and the thermal switch 6 is turned off. If a heater 7 is heated in this condition, an adsorbing agent 8 is deprived of the adsorbing capability, and the same condition is provided as that there is no adsorbing agent 8 in a vacuum container 3. Therefore, since the leakage gas is not adsorbed by the adsorbing agent 8 if a liquid helium gas is leaking out from a very low temperature cell, the leakage gas can positively detected, thereby improving the detection accuracy of the leak test.
申请公布号 JPS6336505(A) 申请公布日期 1988.02.17
申请号 JP19860179135 申请日期 1986.07.30
申请人 TOSHIBA CORP 发明人 SASAKI KATSUTOKI
分类号 H01L39/04;H01F6/04 主分类号 H01L39/04
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