发明名称 Memory cell with diodes providing radiation hardness
摘要 A memory cell has a pair of cross-coupled inverters, such as a CMOS pair. Diodes are coupled in series with the transistors to reduce the possibility of radiation-induced currents in the transistors causing a change in state of the cell by providing resistance that increases the cell time constant. The transistors and the diodes are formed in the body of a semiconducting material. The diodes require at most only a small additional cell area as compared with a cell that does not have the diodes.
申请公布号 US4725875(A) 申请公布日期 1988.02.16
申请号 US19850782581 申请日期 1985.10.01
申请人 GENERAL ELECTRIC CO. 发明人 HSUEH, FU-LUNG
分类号 H01L27/092;H01L27/11;H01L27/12;(IPC1-7):H01L27/02 主分类号 H01L27/092
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