| 摘要 |
PURPOSE:To execute the operation test of the whole chip efficiently by transferring the conents of an instruction register to a control storage address register and then transferring the contents of the control storage address register to a microinstruction register. CONSTITUTION:When a control storage 11 is to be tested, the storing address of the control storage storing a microinstruction to be executed in the external memory is prepared in accordance with the order of the microinstruction to be executed. When only a test control signal C is applied to start a microprocessor, a microcode storing address stored in the external memory is inputted to an instruction queue and transferred to the control storage address register 10 through a decoder 9. The microcode corresponding to the address is read out to a microinstruction register 12 and executed and the test can be attained by observing the execution of the microcode from the external. Thus, the testing efficiency can be improved by controlling the information working processing and transferring the objective test data to a part to be tested. |
