Integrated circuit having a built-in self test design

摘要

An integrated circuit having a built-in self test design, the integrated circuit including a combinatorial logic circuit, a first register coupled to an output of the combinatorial logic circuit and a feedback path via which output signals from the first register are fed back to an input of the combinatorial logic circuit. A multiplexer is provided between the first register and the feedback path, and there is also provided a second register responsive to a signal which is originated to initiate a test function for feeding test signals via the multiplexer and the feedback path to the input of the combinatorial logic circuit.