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发明名称
IC TEST INSTRUMENT
摘要
申请公布号
JPS6316274(A)
申请公布日期
1988.01.23
申请号
JP19860161405
申请日期
1986.07.09
申请人
MITSUBISHI ELECTRIC CORP
发明人
MATSUI HIDEO;SUGIURA KAZUFUMI
分类号
G01R31/26;G01R31/28
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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