| 摘要 |
The method is used for representing, imaging and detecting surface contamination patterns by combined mathematical and numerical analysis, with the possibility of superimposing fragment information to form a corresponding overall information which can be represented with exponentiated selectivity. The primary information is obtained indirectly optically by detecting the useful radiation of a photon or particle beam probe, particularly of a scanning electron microscope. An energy-dispersive signal discrimination provides for selective area distribution analysis of the pattern. The method is also complemented by an initial immuno-histochemical antibody-transported or similar preparation which now provides for a structure-bound selective and thus mathematically quantitative identification of the verification reaction and of the pattern. The use is appropriate in the fields of forensic medicine, medical physics, physical-technical institutes and in the field of securing evidence and detection measures in criminalistics and state security.
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