发明名称 SOLID-STATE IMAGE SENSING ELEMENT
摘要 PURPOSE:To increase mutual conductance without spreading the area of a gate and augmenting the capacitance of an input gate, and to lower noises by forming a transistor, impurity distribution of which under the gate is not equalized, on a head section for an output means. CONSTITUTION:A first P-type well 5, an N<-> semiconductor layer 6 and a second P-type well are shaped onto an N-type substrate 4 in succession, repeating ion implantation and impurity diffusion. Since a second P-type semiconductor layer 7 is extended from the source 25 side, impurity diffusion under a gate 27 is not equalized, and threshold voltage on the source 25 side is made larger than that on the drain 26 side. Accordingly, the mutual conductance of the transistor can be augmented without remarkably increasing the area of the gate 27, input capacitance, and noises are reduced.
申请公布号 JPS63154(A) 申请公布日期 1988.01.05
申请号 JP19860143749 申请日期 1986.06.19
申请人 HITACHI LTD 发明人 OBA SHINYA;TAKAHASHI KENJI;AKIYAMA TOSHIYUKI;OZAWA NAOKI;YOSHIDA ISAO;OZAKI TOSHIBUMI
分类号 H01L27/148;H01L27/146;H04N5/335;H04N5/357;H04N5/369;H04N5/372;H04N5/374 主分类号 H01L27/148
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