| 摘要 |
PURPOSE:To improve the detection ability for a defect and the orientation accuracy for a defective position by performing a flaw detection scan in an actual flaw detection area under flaw detection conditions where focal length is corrected with the same correction rate as that of convergence condition where a reflection echo is highest. CONSTITUTION:Before the flaw detection of the actual flaw detection area 7 is performed, a corner part 4 of a material 2 to be inspected is regarded as a reference convergence condition where the reflection echo is maximum with the standard shape of the material to be inspected, and the delay time of the used element of an array type probe 1 is so calculated that a reflection source can be confirmed and scanned under plural convergence conditions where the focal length is corrected at a specific rate to the reference condition, thereby preparing a data table for confirmation scanning. Similarly, a data table for actual flaw detection is also prepared with respect to the delay time of the used element of the probe 1 corresponding to the convergence condition at each angle of refraction for the actual flaw detection. Then, the reflection source is canned din a focal length series according to the data table for confirmation scanning and a sequence where the focal length is corrected at the same rate with the focal length sequence where the intensity of the reflection echo is highest is selected in the data table for the actual flaw detection to perform actual flaw detection scanning.
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