发明名称 MEASURING METHOD FOR PATTERN AREA RATE
摘要 PURPOSE:To improve the effect of ink presetting for printed matter where a pattern is extremely small by making specific corrections at each measurement point for a plate other than a 'SUMI' (Japanese ink), and totalizing respective corrected data by ink zones and finding an area rate. CONSTITUTION:When the pattern area rate of the color plate other than the 'SUMI' plate is corrected, various alteration is possible and performed by programmed processing by utilizing a microcomputer, etc. For example, three methods are programmed and one of them is selected. In the 1st method, the pattern area rate of each beam spot 5 is set to 0% when the area rate is smaller than a specific value and the value obtained by multiplying the measured value by a specific number is employed as a corrected rate when not smaller than the specific value. In the 2nd method, the pattern area rates of nearby spots 5 are averaged and specific corrections are made according to whether the mean rate is smaller than the specific value or not. In the 3rd method, the pattern area rate of the measured spot 5 is multiplied by the specific number when not smaller than the specific value, a bit indicating the presence of a pattern is set in a corresponding address of a pattern presence/ absence table, and specific corrections are made by ink zones 2 according to whether or not there is a pattern.
申请公布号 JPS62297709(A) 申请公布日期 1987.12.24
申请号 JP19860140930 申请日期 1986.06.17
申请人 TOPPAN PRINTING CO LTD;TOSHIBA MACH CO LTD 发明人 MASUDA TOSHIAKI;OSHIMA AKIRA;TOGASHI KOSAKU;FUJIE HIDEO
分类号 B41F31/02;G01B11/28 主分类号 B41F31/02
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