发明名称 AN ELECTRODE CONNECTION STRUCTURE IN A SEMICONDUCTOR DEVICE
摘要 <p>A compact connection structure between two electrodes made of two types of metals, i.e., metals which respectively make Schottky and ohmic contact with a semiconductor, is provided by using a high melting point metal or silicide thereof which makes Schottky contact with the semiconductor as one electrode metal. The two types of electrodes can be brought into direct contact with each other, enabling elimination of through hole connections between them and therefore increased semiconductor device density.</p>
申请公布号 EP0078679(B1) 申请公布日期 1987.12.23
申请号 EP19820305765 申请日期 1982.10.29
申请人 FUJITSU LIMITED 发明人 NAKAYAMA, YOSHIRO;SUZUKI, HIDETAKE
分类号 H01L21/28;H01L21/338;H01L23/485;H01L27/095;H01L29/417;H01L29/45;H01L29/47;H01L29/80;H01L29/812;(IPC1-7):H01L29/40;H01L23/48 主分类号 H01L21/28
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